| 摘要 |
PROBLEM TO BE SOLVED: To perform redundant replacing test having higher efficiency of replacement and to improve productivity by discriminating whether a redundant program means is used for a redundant memory cell operation test function before redundancy replacement or not. SOLUTION: A redundancy detecting circuit 30 detecting whether a redundant program means is used or not is provided, at a redundancy memory cell test, operation of a redundant memory cell decoder 15 is controlled in accordance with whether a redundant program means 16 is used or not. Also, at redundant memory cell test, a defective region is caused forcedly in the redundant memory cell being used already for redundancy replacement by the redundant memory cell decoder 15, the number of effective loaded redundant memory cells of the semiconductor memory is recognized for a test device/test program.
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