DEVICE AND METHOD FOR DIAGNOSING IC TESTER

摘要

PROBLEM TO BE SOLVED: To allow proper diagnosis in a short time. SOLUTION: An IC tester diagnosing device for diagnosing an IC tester for testing an examined object is improved in the present invention. Plural diagnosing means for conducting classification to a partition based on properties and failure occurrence frequencies of constitutive components, and a partition based on a degree of detailness in contents of the failures to diagnose the IC tester are provided in the device of the present invention.