发明名称 MANUFACTURING METHOD OF SOLID-STATE IMAGING ELEMENT HAVING MICROLENS
摘要 PROBLEM TO BE SOLVED: To provide the manufacturing method of a solid-state imaging pickup element for improving hardness in a microlens. SOLUTION: After a plurality of light-sensing element arrays are formed at the upper section of a semiconductor substrate 10, and a plurality of microlenses 25a are formed at the upper section of the semiconductor substrate 10, where the light sensing element arrays are formed. Then, DUV is irradiated to the microlenses 25a for hardening the surface of the microlenses 25a, the phenomenon of damaging the microlenses 25a is reduced in the succeeding assembly processes, and at the same time, generation of dark sports due to silicon powder is prevented, when die is cut.
申请公布号 JP2002334982(A) 申请公布日期 2002.11.22
申请号 JP20020046717 申请日期 2002.02.22
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KIM SANG-SIK
分类号 G02B3/00;B29D11/00;H01L27/14;H01L27/146;H01L27/148;H04N5/335;(IPC1-7):H01L27/14 主分类号 G02B3/00
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