发明名称 |
SHAPE MEASURING APPARATUS AND METHOD |
摘要 |
PROBLEM TO BE SOLVED: To facilitate measuring thickness variation in a thin plate member such as a wefer accurately and efficiently. SOLUTION: The beam diameter of light gathered with a lens 1 is focused to ca. 0.1 mm by passing it in a polarization beam splitter 2 and irradiating the thin plate member 4 twice with measuring light, and the distortion of light signal is reduced to 1/2 by placing a lens 5 on a different surface of the polarization beam splitter 2.
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申请公布号 |
JP2002333311(A) |
申请公布日期 |
2002.11.22 |
申请号 |
JP20010139752 |
申请日期 |
2001.05.10 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KUBO KEIJI;IMADA YUKIO;TAKEUCHI HIROYUKI;HANDA KOJI;YOSHIZUMI KEIICHI |
分类号 |
G01B11/24;G01B9/02;G01B11/02;H01L21/66;(IPC1-7):G01B11/24 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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