| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit which can be suitably used for a measurement device, such as a semiconductor integrated circuit testing set and the like, in which junction temperature and jitters hardly fluctuate, even if the frequency of an inputted clock fluctuates, and high accuracy is demanded on time. SOLUTION: There are provided a logic circuit 11-1, a plurality of auxiliary logic circuits 13a to 13e, provided for the logic circuit 11-1, and circuits (14a to 14h) for selecting the auxiliary logic circuits 13a to 13e which are made to operate according to the period of a signal CLK2S, which is supplied to the logic circuit 11-1.
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