发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND SEMICONDUCTOR MANUFACTURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a technology for improving the film quality of a thin film formed by electroplating method. SOLUTION: In depositing a Cu film by the electroplating method, a voltage is applied between a cathode electrode 27 and an anode electrode 28 by a constant potential source 25, such that the electric potential of the cathode 27 is lower than the oxidation-reduction potential, found from the relation E=-0.059 pH and the electric potential of the anode electrode 28 is higher than the oxidation-reduction potential found from the relation E=1.23-0.059 pH, where pH is the hydrogen-ion exponent of the plating solution.
申请公布号 JP2002334851(A) 申请公布日期 2002.11.22
申请号 JP20010136232 申请日期 2001.05.07
申请人 HITACHI LTD 发明人 KANEOKA TAKU
分类号 C25D7/12;C25D21/12;H01L21/288;H01L21/3205;H01L23/52;(IPC1-7):H01L21/288;H01L21/320 主分类号 C25D7/12
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