| 摘要 |
PROBLEM TO BE SOLVED: To verify a program for a semiconductor test prepared for a semiconductor device provided with an analogue output terminal. SOLUTION: A command for acquiring an analog waveform contained in the device test program 112 is executed, a content thereof is analyzed by a language analysis executing part 116, and then reading-in of the analog waveform is indicated from a tester library 118 to a tester bus emulator 120. A virtual device 150 conducts processing for generating, in a pseudo form, the analog waveform output from the semiconductor device, using a file stored in a file storage part 151 or a function registered in a function registration part 152. |
