发明名称 Crystal growth method for nitride semiconductor and formation method for semiconductor device
摘要 Methods of crystal growth for semiconductor materials, such as nitride semiconductors, and methods of manufacturing semiconductor devices are provided. The method of crystal growth includes forming a number of island crystal regions during a first crystal growth phase and continuing growth of the island crystal regions during a second crystal growth phase while bonding of boundaries of the island crystal regions occurs. The second crystal growth phase can include a crystal growth rate that is higher than the crystal growth rate of the first crystal growth phase and/or a temperature that is lower than the first crystal growth phase. This can reduce the density of dislocations, thereby improving the performance and service life of a semiconductor device which is formed on a nitride semiconductor made in accordance with an embodiment of the present invention.
申请公布号 US2002170489(A1) 申请公布日期 2002.11.21
申请号 US20020121257 申请日期 2002.04.11
申请人 BIWA GOSHI;OKUYAMA HIROYUKI;DOI MASATO;OOHATA TOYOHARU 发明人 BIWA GOSHI;OKUYAMA HIROYUKI;DOI MASATO;OOHATA TOYOHARU
分类号 C23C16/34;C30B25/02;H01L21/20;H01L21/205;H01L33/12;H01L33/32;H01S5/323;(IPC1-7):C30B23/00;C30B25/00;C30B28/12;C30B28/14 主分类号 C23C16/34
代理机构 代理人
主权项
地址