发明名称 Semiconductor device with SOI structure and method of manufacturing the same
摘要 A semiconductor device includes a conductive semiconductor substrate laminated or bonded on a conductive support substrate through a first insulating film, a separation trench which separates a device formation region where at least a desired element is formed, from a region of the semiconductor substrate, a separation trench, and a substrate contact region where the semiconductor substrate is not present. The semiconductor device further includes a second insulating film which fills the separation trench and covers a surface of the substrate contact region, an external connection electrode formed above the semiconductor substrate, and a support substrate connecting section which passes through the first insulating film and the second insulating film in the substrate contact region to connect the external connection electrode and the support substrate.
申请公布号 US2002171109(A1) 申请公布日期 2002.11.21
申请号 US20020178429 申请日期 2002.06.24
申请人 NEC CORPORATION 发明人 KOBAYASHI KENYA
分类号 H01L21/762;H01L21/00;H01L21/3205;H01L21/336;H01L21/44;H01L21/70;H01L21/768;H01L21/84;H01L23/52;H01L25/065;H01L27/01;H01L27/12;H01L29/76;H01L29/786;H01L31/0392;(IPC1-7):H01L27/01;H01L31/039 主分类号 H01L21/762
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