发明名称 Implanted hidden interconnections in a semiconductor device for preventing reverse engineering
摘要 A camouflaged interconnection for interconnecting two spaced-apart regions of a common conductivity type in an integrated circuit or device and a method of forming same. The camouflaged interconnection comprises a first region forming a conducting channel between the two spaced-apart regions, the conducting channel being of the same common conductivity type and bridging a region between the two spaced-apart regions, and a second region of opposite conductivity to type, the second region being disposed between the two spaced-apart regions of common conductivity type and over lying the conducting channel to camouflage the conducting channel from reverse engineering.
申请公布号 US2002173131(A1) 申请公布日期 2002.11.21
申请号 US20020132523 申请日期 2002.04.24
申请人 CLARK WILLIAM M.;BAUKUS JAMES P.;CHOW LAP-WAI 发明人 CLARK WILLIAM M.;BAUKUS JAMES P.;CHOW LAP-WAI
分类号 H01L27/04;H01L21/74;H01L21/822;H01L21/8234;H01L27/02;H01L27/088;(IPC1-7):H01L21/44 主分类号 H01L27/04
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