发明名称 |
X-ray fluorescence spectrometer |
摘要 |
To provide an X-ray fluorescence spectrometer capable of providing a stable fluorescent X-ray intensity regardless of the presence of irregularities or the like on a surface of a sample to be analyzed, the X-ray fluorescence spectrometer includes an X-ray source 1 including a primary X-ray limiting diaphragm 3. An aperture 3a of the primary X-ray limiting diaphragm 3 is of a shape effective to allow change in intensity of fluorescent X-rays 7 measured by a detector 8 to be not higher than 1% in the event that a height of the sample surface 5a relative to the X-ray source 1 and the detector 8 changes 1 mm at maximum.
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申请公布号 |
US2002172322(A1) |
申请公布日期 |
2002.11.21 |
申请号 |
US20020126697 |
申请日期 |
2002.04.22 |
申请人 |
KAWAHARA NAOKI;AOYAGI KOUICHI;YAMADA YASUJIRO |
发明人 |
KAWAHARA NAOKI;AOYAGI KOUICHI;YAMADA YASUJIRO |
分类号 |
G01N23/223;G21K1/02;(IPC1-7):G01T1/36 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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