发明名称 |
Process for detaching semiconductor structures located on a main side of a substrate comprises producing a layer on a further main side of the substrate opposite the main side |
摘要 |
Process for detaching semiconductor structures located on a first main side (101) of a substrate (100) comprises producing a layer on a second main side (102) of the substrate opposite the first main side; structuring the layer so that regions of the substrate are exposed on the second main side; removing substrate material in the exposed regions; bending the substrate so that bending forces are exerted on substrate sites on which previous substrate material was removed; and detaching the semiconductor structures located on the first main side of the substrate using the bending action on the substrate. An Independent claim is also included for a semiconductor substrate. Preferred Features: The layer is structured using lithography or etching. The substrate material is removed in the exposed regions using etching. A material is selected for layer material which selectively can be etched.
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申请公布号 |
DE10122839(A1) |
申请公布日期 |
2002.11.21 |
申请号 |
DE20011022839 |
申请日期 |
2001.05.11 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
LEHMANN, VOLKER |
分类号 |
H01L21/78;(IPC1-7):H01L21/78 |
主分类号 |
H01L21/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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