| 摘要 |
A device for testing the conformity of an electronic connection (1), the device comprising a first signal generator (3) supplying a sequence of input bits to a first extremity (E) of the connection (1), and an error detection device (6) receiving a sequence of output bits from a second extremity (S) of the connection (1), in response to the sequence of input bits. The error detection device (6) comprises: a second signal generator (10) intended to recreate the sequence of input bits and being suitable for predicting the value of the next bit when the second extremity (S) supplies a bit of the output sequence, and information means (14) indicating the presence of an error with means (13) for comparing the value of the predicted bit with the effective value of the next bit of the sequence of output bits. Application: notably for testing integrated circuits.
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