发明名称 Method of cleaning a polishing pad conditioner and apparatus for performing the same
摘要 A polishing pad conditioner cleaning method and an apparatus for effectively removing particles from a polishing pad conditioner. The polishing pad conditioner is immersed into a cleaning liquid contained in a cleaning bath. The cleaning liquid is continuously supplied into the cleaning bath. An inert gas is injected into the cleaning liquid from a bottom of the cleaning bath. The injected inert gas bubbles the cleaning liquid, so that the particles sticking to the polishing pad conditioner are removed and overflow from the cleaning bath. The polishing pad conditioner is effectively cleaned, so that formation of particles and scratches on a wafer are reduced when a polishing process is subsequently carried out using the cleaned polishing pad conditioner.
申请公布号 US6481446(B2) 申请公布日期 2002.11.19
申请号 US20010901049 申请日期 2001.07.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YANG MIN-SOO;KIM MIN-GYU
分类号 H01L21/304;B24B53/007;H01L21/302;H01L21/461;H01L21/8238;(IPC1-7):B08B3/04 主分类号 H01L21/304
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