发明名称 Program executing system for semiconductor testing equipment
摘要 The present invention discloses a program executing system for semiconductor testing equipment that, at the time of compiling and executing the two device test programs including a common program specification command, executes the common program based on an intermediate code inserted at a position corresponding to this program specification command independently of the two device test programs.
申请公布号 US6484116(B1) 申请公布日期 2002.11.19
申请号 US20000574727 申请日期 2000.05.18
申请人 ADVANTEST CORPORATION 发明人 YOKOYAMA MASARU
分类号 G01R31/28;G01R31/319;G06F11/22;(IPC1-7):G01R27/28;G01R31/00 主分类号 G01R31/28
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