发明名称 |
Test simulation of a read/write head |
摘要 |
A test simulation circuit includes a simulated read/write head with a magnet shield and a magnetoresistive sensor exposed at a lapped surface. The test simulation circuit also includes first and second electrical test path connected respectively to the magnet shield and the magnetoresistive sensor. The second electrical test path is electrically isolated from the first electrical test path.
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申请公布号 |
US6483298(B2) |
申请公布日期 |
2002.11.19 |
申请号 |
US20010872627 |
申请日期 |
2001.06.01 |
申请人 |
SEAGATE TECHNOLOGY LLC |
发明人 |
HEIM KEVIN R.;CHANG CLIFTON H.;WEYANDT PETER T.;RYAN PATRICK J. |
分类号 |
G11B5/105;G11B5/31;G11B5/39;G11B5/40;G11B5/455;G11B33/10;(IPC1-7):G01R33/12;G11B5/127 |
主分类号 |
G11B5/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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