发明名称 Multiple plane reference mirror for interferometric testing of optical systems
摘要 An interferometric testing system for testing an optical system includes an interferometer which outputs a light beam and analyzes the returned light beam, and a multiple plane reference mirror which reflects the light beam corresponding to the image point transmitted by the optical system back through the optical system to thereby generate the interference. According to one aspect of the invention, the multiple plane reference mirror reflects the light beam back along the arrival path of the light beam. According to another aspect of the invention, the multiple plane reference mirror comprises a holographic multiple plane reference mirror. The interferometric testing method is also described.
申请公布号 US6480284(B1) 申请公布日期 2002.11.12
申请号 US20000621403 申请日期 2000.07.21
申请人 RAYTHEON COMPANY 发明人 STENTON CONRAD
分类号 G01B9/021;(IPC1-7):G01B9/021 主分类号 G01B9/021
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