发明名称 |
Method for the calibration of an RF integrated circuit probe |
摘要 |
A method for the calibration of an RF integrated circuit probe comprising a step to determine the characteristics of the RF transmission lines of the probe by means of a vector network analyzer and standard circuits on silicon substrate. The standard circuits comprise contact pads corresponding by their layout to RF connection pads of the integrated circuits to be tested.
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申请公布号 |
US6480013(B1) |
申请公布日期 |
2002.11.12 |
申请号 |
US20000499551 |
申请日期 |
2000.02.07 |
申请人 |
STMICROELECTRONICS, S.A. |
发明人 |
NAYLER PETER;SMEARS NICHOLAS;PLANELLE PHILIPPE |
分类号 |
G01R31/28;G01R35/00;(IPC1-7):G01R31/02 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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