发明名称 Plasma chamber support having dual electrodes
摘要 A process chamber 110 capable of processing a substrate 50 in a plasma comprises a dielectric 210 covering a first electrode 220 and a second electrode 230, a conductor 250 supporting the dielectric 210, and a voltage supply 170 to supply an RF voltage to the first electrode 220 or the second electrode 230 in the dielectric 210. The first electrode 220 capacitively couples with a process electrode 225 to energize process gas in the process chamber 110 and RF voltage applied to the second electrode 230 is capacitively coupled to the conductor 250 and through a collar 260 or the second electrode 230 is directly capacitively coupled through the collar 260.
申请公布号 US6478924(B1) 申请公布日期 2002.11.12
申请号 US20000513992 申请日期 2000.03.07
申请人 APPLIED MATERIALS, INC. 发明人 SHAMOUILIAN SHAMOUIL;KHOLODENKO ARNOLD;WONG KWOK MANUS;WANG LIANG-GUO;VEYTSER ALEXANDER M.;GRIMARD DENNIS S.
分类号 H01L21/683;(IPC1-7):H05H1/00 主分类号 H01L21/683
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