发明名称 Single electron transistor using porous silicon and manufacturing method thereof
摘要 A single electron transistor using porous silicon, which is fabricated by applying porous silicon having a size of several tens of nanometers obtained by electrochemically etching silicon, and a fabrication method thereof, are provided. In the single electron transistor using porous silicon, silicon pores, each of which has a diameter of 5 nm or less, are fabricated by electrochemically etching a silicon on insulator (SOI) substrate having silicon dioxide (SiO2) in its lower portion using an HF-based solution, and serve as islands of a single electron transistor. Also, a source and a drain are formed of silicon on which metal is deposited or silicon doped with impurities. Hence, formation of islands and tunnel barriers is easy, mass production is possible, and the sizes of islands can be controlled by oxidation, so that single electron transistors capable of operating at room temperature can be easily fabricated.
申请公布号 US6479365(B2) 申请公布日期 2002.11.12
申请号 US20020090169 申请日期 2002.03.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE JO-WON;KIM CHUNG-WOO;KIM BYONG-MAN;KIM MOON-KYUNG
分类号 H01L29/16;H01L29/76;(IPC1-7):H01L21/76 主分类号 H01L29/16
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