发明名称 Full CMOS SRAM cell
摘要 A full CMOS SRAM cell includes first and second active regions formed in a semiconductor substrate. A word line traverses first and second areas of the second active region, and first and second gate electrodes are arranged to be perpendicular to the word line. The first and second gate electrodes are parallel to each other and traverse the first and second active regions, respectively. A power line is electrically connected to a first common source region and is arranged parallel to the word line, the first common source region being the first active region between the first gate electrode and the second gate electrode. A ground line is electrically connected to a second common source region and is arranged parallel to the word line, the second common source region being the second active region between the first gate electrode and the second gate electrode. First and second bit lines are arranged to be perpendicular to the word line and parallel to each other.
申请公布号 US6479905(B1) 申请公布日期 2002.11.12
申请号 US20000620666 申请日期 2000.07.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SONG JUN-EUI
分类号 H01L21/8244;H01L27/11;(IPC1-7):H01L27/11 主分类号 H01L21/8244
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