发明名称 THERMAL MECHANICAL PLANARIZATION IN INTEGRATED CIRCUITS
摘要 PURPOSE: Thermal mechanical planarization in integrated circuits is provided to accommodate the low-k material when forming the interconnect and to achieve an inexpensive, high product throughput, and simple process. CONSTITUTION: A method for planarization of ILD layers on a semiconductor wafer(14) includes providing an oven having a wafer holder(26) therein, placing the semiconductor wafer on the wafer holder, and simultaneously applying mechanical pressure and heat to the ILD layer on the semiconductor wafer using a mechanical device.
申请公布号 KR20020084834(A) 申请公布日期 2002.11.11
申请号 KR20020024509 申请日期 2002.05.03
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD. 发明人 LEONG LUP SAN
分类号 H01L21/768;B24B1/00;B24B37/04;H01L21/302;H01L21/31;(IPC1-7):H01L21/302 主分类号 H01L21/768
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