发明名称 MAGNETIC MEMORY ELEMENT TESTING SYSTEM AND METHOD
摘要 A method and system for testing a magnetic memory element by applying a sequence of test routines in which each test routine is a programmed sequence to tests and analyses; each routine having programmed segments and each segment having programmed steps. A programmed test control provides test parameter and step selection control signals. A programmed timing control selects steps to be performed in response to the step selection signals and generates timing signals as programmed in each of the selected steps. A test pulse generator produces test signals in response to the test parameter control signals and the timing signals.
申请公布号 US3655959(A) 申请公布日期 1972.04.11
申请号 USD3655959 申请日期 1970.08.17
申请人 COMPUTER TEST CORP. 发明人 GARY ALLEN CHERNOW;HYMAN GAIL
分类号 G11C29/56;(IPC1-7):G11C29/00 主分类号 G11C29/56
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