发明名称 |
MAGNETIC MEMORY ELEMENT TESTING SYSTEM AND METHOD |
摘要 |
A method and system for testing a magnetic memory element by applying a sequence of test routines in which each test routine is a programmed sequence to tests and analyses; each routine having programmed segments and each segment having programmed steps. A programmed test control provides test parameter and step selection control signals. A programmed timing control selects steps to be performed in response to the step selection signals and generates timing signals as programmed in each of the selected steps. A test pulse generator produces test signals in response to the test parameter control signals and the timing signals.
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申请公布号 |
US3655959(A) |
申请公布日期 |
1972.04.11 |
申请号 |
USD3655959 |
申请日期 |
1970.08.17 |
申请人 |
COMPUTER TEST CORP. |
发明人 |
GARY ALLEN CHERNOW;HYMAN GAIL |
分类号 |
G11C29/56;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/56 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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