发明名称 PROBE DEVICE
摘要 PROBLEM TO BE SOLVED: To fabricate parts constituting a probe device in advance. SOLUTION: A probe device 30 is provided with a printed circuit board 40 having a through window 41 at its center, a top clamp 50 having a through window 51 at its center and to be fixed onto the printed circuit board 40, a mounting base clamp 60 to be fixed onto this top clamp 50, a plurality of mounting bases 70 arranged inside the through window 41 of the printed circuit board 40 and the through window 51 of the top clamp 50 and fixed to a bottom face 63 of the mounting base clamp 60, and a contact probe 1 having a plurality of contact pins 2a provided on a bottom face 75 of each of the mounting bases 70 and electrically connected to the printed circuit board 40.
申请公布号 JP2002323538(A) 申请公布日期 2002.11.08
申请号 JP20010127743 申请日期 2001.04.25
申请人 MITSUBISHI MATERIALS CORP 发明人 SUGIYAMA TATSUO;ITO KENICHI
分类号 G01R1/06;G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R1/06
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