发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To correspond readily to modification in the command, the address and the I/O configuration of a memory macro functional block in a memory macro functional block embedded LSI. SOLUTION: A memory macro functional block 10 is physically divided into a memory core functional block 12 and an interface functional block 11. The interface functional block comprises a test circuit 111, a command decoder section 112 for a test, an address decoder section 113 for a test, and a memory core I/O circuit 114 to input a command and an address into the memory core functional block and to exchange data with the memory core functional block. The interface functional block further comprises a composition storage block 115 storing the memory capacity of the memory core functional block and the information on a memory core configuration, and the configuration control block 116 to control the data path and the address path of the memory core functional block based on stored information.
申请公布号 JP2002324395(A) 申请公布日期 2002.11.08
申请号 JP20010130076 申请日期 2001.04.26
申请人 TOSHIBA CORP 发明人 KOUCHI TOSHIYUKI;TAKAHASHI MAKOTO;NUMATA KENJI
分类号 G11C11/41;G11C5/02;G11C11/401;G11C11/413;G11C29/00;G11C29/02;H01L21/82;H01L21/822;H01L27/02;H01L27/04;H01L27/108;H01L27/118;H01L31/072;(IPC1-7):G11C11/401 主分类号 G11C11/41
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