| 摘要 |
PROBLEM TO BE SOLVED: To reduce a workload for preparing a test case condition corresponding to a system LSI of different specifications by using the existing test items. SOLUTION: A model configuration information converting part 110 for test case generation having a model configuration storing part 100 for storing a model configuration, a test item storing part 101 for storing a test item and a control procedure storing part 102 for storing a control procedure, inputs a model identifier specifying a model, retrieves the mode configuration storing part 100 by using the inputted model identifier to acquire a model configuration, and generates model configuration information for test case generation by using a test time read in from the test item storing part 101 and the model configuration. A control procedure information converting part 130 for test case generation inputs the model identifier and the model configuration information for test case generation and generates a test case generation condition by using a control procedure obtained by retrieving the control procedure storing part 102 by using the model identifier, the model configuration information for test case generation and the control procedure. |
