MASTER INFORMATION CARRIER DEFECT INSPECTION METHOD MAGNETIC FILM PATTERN TRANSFER METHOD USING MASTER INFORMATION CARRIER, AND MAGNETIC RECORDING/REPRODUCING DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a defect inspection method of a master information carrier, which detects without fail the defects caused by the master information carrier in a magnetic-transfer method which carries out transfer by making a magnetic disk contact physically close the master information carrier. SOLUTION: By preparing an inspection plate 100 and making a master information carrier 2 closely contact the plate 100 for inspection instead of a direct defect inspection using the master information carrier, defects on the master information carrier 2 are transferred to the plate 100 for inspection, and the defects are indirectly inspected on the plate 100. Defects on the plate 100 for the 1st state are inspected before contacting the carrier and the plate, and compared with the defects on the plate 100 for the 2nd state after contacting.