发明名称 |
IRON SILICIDE FILM FORMING METHOD, SEMICONDUCTOR WAFER AND OPTICAL SEMICONDUCTOR DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide an iron silicide film forming method, a semiconductor wafer and an optical semiconductor device for forming a thick and continuousβ-FeSi2 film having a good quality. SOLUTION: The method of forming an iron silicide film layer 4 orβ-FeSi2 on an Si wafer 1 having a crystal plane (001) on the surface comprises an SiGe layer forming step of epitaxially growing an SiGe layer 2 on the Si wafer, and an iron silicide layer forming step of epitaxially growing the iron silicide layer on the SiGe layer.</p> |
申请公布号 |
JP2002324765(A) |
申请公布日期 |
2002.11.08 |
申请号 |
JP20010127742 |
申请日期 |
2001.04.25 |
申请人 |
MITSUBISHI MATERIALS SILICON CORP;MITSUBISHI MATERIALS CORP |
发明人 |
YAMAGUCHI KENJI;MIZUSHIMA KAZUKI |
分类号 |
C30B29/52;H01L21/205;H01L21/28;H01L31/04;(IPC1-7):H01L21/28 |
主分类号 |
C30B29/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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