发明名称 IRON SILICIDE FILM FORMING METHOD, SEMICONDUCTOR WAFER AND OPTICAL SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an iron silicide film forming method, a semiconductor wafer and an optical semiconductor device for forming a thick and continuousβ-FeSi2 film having a good quality. SOLUTION: The method of forming an iron silicide film layer 4 orβ-FeSi2 on an Si wafer 1 having a crystal plane (001) on the surface comprises an SiGe layer forming step of epitaxially growing an SiGe layer 2 on the Si wafer, and an iron silicide layer forming step of epitaxially growing the iron silicide layer on the SiGe layer.</p>
申请公布号 JP2002324765(A) 申请公布日期 2002.11.08
申请号 JP20010127742 申请日期 2001.04.25
申请人 MITSUBISHI MATERIALS SILICON CORP;MITSUBISHI MATERIALS CORP 发明人 YAMAGUCHI KENJI;MIZUSHIMA KAZUKI
分类号 C30B29/52;H01L21/205;H01L21/28;H01L31/04;(IPC1-7):H01L21/28 主分类号 C30B29/52
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