发明名称 Low dielectric constant shallow trench isolation
摘要 Techniques of shallow trench isolation and devices produced therefrom. The techniques of shallow trench isolation utilize foamed polymers, cured aerogels or air gaps as the insulation medium. Such techniques facilitate lower dielectric constants than the standard silicon dioxide due to the cells of gaseous components inherent in foamed polymers, cured aerogels or air gaps. Lower dielectric constants reduce capacitive coupling concerns and thus permit higher device density in an integrated circuit device.
申请公布号 US2002164859(A1) 申请公布日期 2002.11.07
申请号 US20020184592 申请日期 2002.06.27
申请人 MICRON TECHNOLOGY, INC. 发明人 FARRAR PAUL A.
分类号 H01L21/762;(IPC1-7):H01L21/336 主分类号 H01L21/762
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