METHOD AND CIRCUIT FOR TESTING HIGH FREQUENCY MIXED SIGNAL CIRCUITS WITH LOW FREQUENCY SIGNALS

摘要

A method of testing an analog (106), or mixed analog and digital (122), circuit (100) designed for operation at a clock frequency including multiplexing (104) a plurality of low frequency stimulus signals (103) using a high frequency clock to produce a circuit input signal (105), applying the input signal (105) to the circuit (106) to obtain a circuit output signal (109); sampling the circuit output signal (109) synchronously with the high frequency clock at a frequency equal to the clock frequency divided by the number of the low frequency signals; storing the samples and measuring properties of the signal samples to determine properties of the output signal of the circuit.