| 摘要 |
An insulated device diagnosing system capable of judging the deterioration, lifetime, defects and so on of a device highly sensitively and precisely. The intensity at each voltage phase angle is measured at a plurality of specific frequencies taking high voltage phase angles as the abscissas. The deterioration, lifetime and the kind and extent of abnormality of the device are judged from the pattern and intensity of the spectral distribution which is obtained by peak-holding the measured intensity for some time period. According to the present invention, partial discharge can be measured highly sensitively and precisely to diagnose the deterioration, lifetime and the extent of defect of the device. As a result, the insulation reliability of the device can be improved, and which part of the device should be repaired/replaced can be grasped before disassembly of the device, thereby cutting the maintenance cost.
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