发明名称 PHASE-BASED WAVELENGTH MEASUREMENT APPARATUS
摘要 <p>A laser wavemeter (10, 20, 30) determines the unknown wavelength of a laser (11a) by measuring the phase difference between two orthogonally polarized beams derived from the laser. The orthogonally polarized beams propagate along two optical paths of different lengths as defined, for example, by a polarizing beam splitter (14, 24, 36a, 36b, 36c) or a stepped reflector (26) with a defined step height (26a, 26b). An in situ reference laser (11b) of known wavelength allows calculation and monitoring of the path difference between the two optical paths.</p>
申请公布号 WO2002088629(A1) 申请公布日期 2002.11.07
申请号 US2002013700 申请日期 2002.04.30
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址