发明名称 Physical property determination using surface enhanced raman emissions
摘要 A method of and apparatus for determining a physical property of a material. The method includes: attaching nanoparticles to a substrate; positioning the substrate near the material; illuminating the nanoparticles with photons having wavelengths that stimulate surface enhanced Raman emissions; detecting photons emitted as a result of the illumination; and determining said physical property of said material using said detected photons. The apparatus includes: a substrate; nanoparticles attached to the substrate; a light source, connected to the substrate, for illuminating the nanoparticles with photons having wavelengths that stimulate surface enhanced Raman emissions; a photodetector, connected to the substrate, for detecting photons emitted as a result of illumination of the nanoparticles; and a processor, connected to the photodetector, for determining a property of material near the nanoparticles from the detected photons. The inventive method and apparatus are particularly adapted for use in connection with hydrocarbon exploration and production activities.
申请公布号 US2002163639(A1) 申请公布日期 2002.11.07
申请号 US20010848892 申请日期 2001.05.04
申请人 STEPHENSON KENNETH E. 发明人 STEPHENSON KENNETH E.
分类号 G01J3/44;G01N21/65;(IPC1-7):G01J3/44 主分类号 G01J3/44
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