发明名称 Method of fabricating semiconductor device
摘要 A method of fabricating a semiconductor device capable of improving productivity by efficiently polycrystallizing an amorphous silicon film is obtained. This method of fabricating a semiconductor device comprises steps of forming an amorphous film on a substrate, forming a conductor film on the substrate, arranging the substrate so that the surface of the conductor film is substantially parallel to an electric field in a waveguide and irradiating the conductor film with an electromagnetic wave thereby making the conductor film generate heat and crystallizing the amorphous film with the heat. Thus, the substrate is arranged to be substantially parallel to the electric field in the waveguide, whereby the absorptivity of the conductor film for the electromagnetic wave is improved and hence the conductor film can be efficiently heated. Thus, crystallization is performed in a short time, thereby improving productivity. The amorphous film is indirectly homogeneously heated through the conductor film having stable absorptivity regardless of the surface state of the amorphous film, whereby the yield is improved in crystallization of the amorphous film.
申请公布号 US2002164864(A1) 申请公布日期 2002.11.07
申请号 US20020091429 申请日期 2002.03.07
申请人 SANYO ELECTRIC CO., LTD. 发明人 SOTANI NAOYA
分类号 H01L21/20;H01L21/268;H01L21/336;H01L29/786;(IPC1-7):H01L21/46 主分类号 H01L21/20
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