发明名称 |
METHOD OF TESTING EMBEDDED MEMORY ARRAY AND EMBEDDED MEMORY TEST CONTROLLER FOR USE THEREWITH |
摘要 |
A memory test controller comprises a test instruction register array for storing a plurality of test instructions, each register having instruction fields for storing instruction data specifying operations to be performed on the memory array, a repeat module for repeating a group of one or more of the test instructions with modified data, the repeat module including storage means for storing instruction field modification data; and each register of the test instruction register array including an instruction field for enabling or disabling the repeat module. |
申请公布号 |
WO02089146(A2) |
申请公布日期 |
2002.11.07 |
申请号 |
WO2002CA00533 |
申请日期 |
2002.04.19 |
申请人 |
LOGICVISION, INC.;ABBOTT, ROBERT, A. |
发明人 |
ABBOTT, ROBERT, A. |
分类号 |
G11C29/26 |
主分类号 |
G11C29/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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