发明名称 SYSTEM AND METHOD FOR SELF-REFERENCING CALIBRATION
摘要 A method of calibrating a spectrographic inspection system, comprises providing a plurality of packages, each of the plurality of packages containing a group of items, wherein each of the groups of items has a known composition, measuring the reflectance value of each of the groups of items and thereby obtaining a reference reflectance value set, normalizing the reference reflectance value set and thereby creating a normalized reference reflectance value set, and storing the normalized reference reflectance value set.
申请公布号 WO02065100(A3) 申请公布日期 2002.11.07
申请号 WO2002US03285 申请日期 2002.02.07
申请人 ANALYTICAL SPECTRAL DEVICES, INC. 发明人 CURTISS, BRIAN;FAUS, ROBERT, J.;FELDMAN, LEONID, G.
分类号 B07C5/342;G01J3/28;G01N21/27;G01N21/95 主分类号 B07C5/342
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