发明名称 |
POLISHING PAD FOR SEMICONDUCTOR WAFER AND LAMINATED BODY FOR POLISHING OF SEMICONDUCTOR WAFER EQUIPPED WITH THE SAME AS WELL AS METHOD FOR POLISHING OF SEMICONDUCTOR WAFER |
摘要 |
PURPOSE: A polishing pad for a semiconductor wafer is provided to optically monitor every polishing state at all times during a polishing process as well as a polishing endpoint by easily performing an optical endpoint detection process without lowering the polishing performance. CONSTITUTION: The polishing pad(1) includes a water-insoluble matrix material such as crosslinked 1,2-polybutadiene and a water-soluble particle such as beta-cyclodextrin dispersed in this water-insoluble matrix material. The polishing pad has light transmitting properties so that polishing endpoint can be detected with a light.
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申请公布号 |
KR20020083136(A) |
申请公布日期 |
2002.11.01 |
申请号 |
KR20020022405 |
申请日期 |
2002.04.24 |
申请人 |
JSR CORPORATION |
发明人 |
KOU HASEGAWA |
分类号 |
H01L21/304;B24B37/013;B24B37/04;B24B37/20;B24D3/34;B24D7/12;B24D13/12;B24D13/14;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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