发明名称 POLISHING PAD FOR SEMICONDUCTOR WAFER AND LAMINATED BODY FOR POLISHING OF SEMICONDUCTOR WAFER EQUIPPED WITH THE SAME AS WELL AS METHOD FOR POLISHING OF SEMICONDUCTOR WAFER
摘要 PURPOSE: A polishing pad for a semiconductor wafer is provided to optically monitor every polishing state at all times during a polishing process as well as a polishing endpoint by easily performing an optical endpoint detection process without lowering the polishing performance. CONSTITUTION: The polishing pad(1) includes a water-insoluble matrix material such as crosslinked 1,2-polybutadiene and a water-soluble particle such as beta-cyclodextrin dispersed in this water-insoluble matrix material. The polishing pad has light transmitting properties so that polishing endpoint can be detected with a light.
申请公布号 KR20020083136(A) 申请公布日期 2002.11.01
申请号 KR20020022405 申请日期 2002.04.24
申请人 JSR CORPORATION 发明人 KOU HASEGAWA
分类号 H01L21/304;B24B37/013;B24B37/04;B24B37/20;B24D3/34;B24D7/12;B24D13/12;B24D13/14;(IPC1-7):H01L21/304 主分类号 H01L21/304
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