发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device that can reduce production of a sub-threshold current in an operation standby state. SOLUTION: The semiconductor device where an N-channel substrate part exists in its semiconductor substrate and a plurality of PMOS transistors(TRs) 1 isolated by gate isolation gate electrodes 3 are formed on the N-channel substrate, is provided with the gate isolation gate electrodes 3, an N-channel substrate potential application section 4, a voltage application means 6 that applies a voltage to a source region 2 in a way that a voltage applied to the former is higher than a voltage applied to the latter, and a control means 7 that activates the voltage application means 6 in a standby state of the PMOS TRs 1.
申请公布号 JP2002319858(A) 申请公布日期 2002.10.31
申请号 JP20010123880 申请日期 2001.04.23
申请人 MITSUBISHI ELECTRIC CORP;MITSUBISHI ELECTRIC ENGINEERING CO LTD 发明人 TERANISHI SAE;TANIZAKI HIROAKI
分类号 H01L21/76;H01L21/822;H01L21/8238;H01L27/04;H01L27/08;H01L27/092;H03K19/0948;(IPC1-7):H03K19/094;H01L21/823 主分类号 H01L21/76
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