发明名称 NONVOLATILE MEMORY DEVICE WITH 2-TRANSISTOR OF 2-BIT PERFORMANCE
摘要 PURPOSE: A nonvolatile memory device for performing 2-bit operation with 2-transistor as a unit cell is provided to improve a trap efficiency of electrons and an integration degree by forming two memory cells between a pair of bit lines and storing 2-bit data. CONSTITUTION: A semiconductor substrate of a first conductive type includes a first and a second channel regions(83,84) adjacent together. A first and a second conductive gates(71,72) are formed on the first and second channel regions(83,84), respectively. A first and a second insulating layers(65,70) are formed between the first and second conductive gates(71,72) and the substrate, respectively. At this time, the first and second insulating layers(65,70) are composed of ONO(Oxide-Nitride-Oxide) structure, wherein the nitride used as an electron trap film. A first and a second junction regions(81,82) of a second conductive type are formed in the substrate and overlapped to the gates(71,72).
申请公布号 KR20020082668(A) 申请公布日期 2002.10.31
申请号 KR20010022389 申请日期 2001.04.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SEONG GYUN
分类号 G11C16/04;H01L21/28;H01L21/336;H01L21/8246;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/115;H01L21/824 主分类号 G11C16/04
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