| 摘要 |
PROBLEM TO BE SOLVED: To provide a three-dimensional shape measuring method having improved measurement accuracy. SOLUTION: Lattice patterns are projected simultaneously onto a measuring object with changed colors relative to each of plural one-dimensional lattices 1-3 having mutually different cycles and directions. A lattice image deformed corresponding to the three-dimensional shape of the measuring object is imaged, and the lattice image is separated into one-dimensional lattice components in each color, and phases are detected in each one-dimensional lattice component, to thereby acquire measured values of the three-dimensional shape based on each phase. The measuring object is also imaged by white light, to thereby also measure color information of the measuring object. |
