发明名称 Method and apparatus for measuring temperature parameters of an ISFET using hydrogenated amorphous as a sensing film
摘要 A method and an apparatus for measuring the temperature parameters of an ISFET that uses hydrogenated amorphous silicon as a sensing film, which uses the measurements of the temperature parameters and the source/drain current and gate voltage in an unknown solution to sense the ion concentration and the pH value of the unknown solution.
申请公布号 US2002158645(A1) 申请公布日期 2002.10.31
申请号 US20020131777 申请日期 2002.04.23
申请人 NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY 发明人 CHOU JUNG CHUAN;WANG YII FANG
分类号 G01R31/26;(IPC1-7):G01R31/02 主分类号 G01R31/26
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