发明名称 Etching depth controlling method in DRAM fabricating process, involves etching two reflecting regions subsequently until etching depth of both regions are made equal
摘要 Two reflecting regions (36,37) formed on a substrate (30) is illuminated to a coherence light to generate an interference. One region is etched initially until forming a height difference between the two regions by changing the interference intensity slightly. Other region is etched until the etch depth is made same as the height difference by changing the interference intensity extremely.
申请公布号 DE10121239(A1) 申请公布日期 2002.10.31
申请号 DE20011021239 申请日期 2001.04.30
申请人 PROMOS TECHNOLOGIES, INC. 发明人 FU, CHING-HUNG;TSAI, NIEN-YU
分类号 G01B11/22;H01L21/302;H01L21/308;H01L21/3213;H01L21/461;H01L21/66;(IPC1-7):H01L21/66 主分类号 G01B11/22
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