发明名称 Ruthenium interconnect for an integrated circuit and method for its fabrication
摘要 A multi-layered metal bond pad for a semiconductor die having a conductive metal layer and an overlying ruthenium electrode layer. The ruthenium electrode layer protects the conductive metal from oxidation due to ambient environmental conditions. An interconnect structure such as a wire bond or solder ball may be attached to the ruthenium layer to connect the semiconductor die to a lead frame or circuit support structure. Also disclosed are processes for forming the ruthenium layer.
申请公布号 US2002158336(A1) 申请公布日期 2002.10.31
申请号 US20020183852 申请日期 2002.06.28
申请人 MICRON TECHNOLOGY, INC. 发明人 JIANG TONGBI;LI LI
分类号 H01L21/288;H01L21/48;H01L21/60;H01L23/498;(IPC1-7):H01L29/40;H01L23/52;H01L23/48;H01L21/44 主分类号 H01L21/288
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