发明名称 SIMULTANEOUS PROCESSING CLEANING SYSTEM FOR MANY WORK SUBSTRATES
摘要 PROBLEM TO BE SOLVED: To provide a many-sheet simultaneous processing plasma cleaning device which performs control for obtaining the best processing conditions at any time for higher uniformity and good efficiency, since, specially, variance in out-surface uniformity is large when a plurality of magazines, etc., each mounted with many large-sized work substrates or work substrates are subjected to plasma processing together. SOLUTION: This many-sheet simultaneous processing plasma cleaning system has high uniformity and good efficiency and is enabled to easily perform quality control by work substrates by setting and holding the best conditions of cleaning, by detecting self-bias voltages generated between respective electrodes and controlling respective high-frequency output and gas supply controllers or the degree of vacuum, etc.
申请公布号 JP2002319564(A) 申请公布日期 2002.10.31
申请号 JP20010159669 申请日期 2001.04.20
申请人 MORI ENGINEERING:KK 发明人 SAITO MIYUKI;HATANAKA TOSHIHIKO;MIURA SHUNJI;SAKURAI RIKUO
分类号 H01L21/677;H01L21/304;H01L21/68;(IPC1-7):H01L21/304 主分类号 H01L21/677
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