发明名称 METHOD OF INSPECTING TRACE OF PROBING NEEDLE
摘要 PROBLEM TO BE SOLVED: To provide a method of inspecting a trace of probing needle capable of readily and accurately determining only the trace of a probing needle applied on a pad irrespective of the surface condition of the pad. SOLUTION: Image data A, B is obtained before and after the trace 3 of the probing needle is applied on the pad 31 to be inspected. The data A is compared with the data B to obtain image data C of only the trace 3, and then the trace 3 of the probing needle applied on the pad 31 to be inspected is specified.
申请公布号 JP2002318263(A) 申请公布日期 2002.10.31
申请号 JP20010124014 申请日期 2001.04.23
申请人 SONY CORP 发明人 MAEDA KAZUNORI
分类号 G01R31/26;G01N21/956;G01R1/06;H01L21/66;(IPC1-7):G01R31/26 主分类号 G01R31/26
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