发明名称 METHOD FOR MANUFACTURING COMPOUND SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To obtain a free standing compound semiconductor wafer low in crack, chipping, or the like. SOLUTION: A protective film 2 covering at least the side surface of a sapphire substrate 1 is deposited on the surface of the sapphire substrate 1. Next, a GaN film 3 (a compound semiconductor film) is epitaxially grown on the exposed surface of the sapphire substrate 1. Next, the GaN film 3 is separated from the sapphire substrate 1 by laser beam irradiation, the grinding of the substrate, etching, cutting, or the like. The GaN film 3 is used as a free standing wafer.
申请公布号 JP2002316893(A) 申请公布日期 2002.10.31
申请号 JP20020011855 申请日期 2002.01.21
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TAMURA SATOYUKI;OGAWA MASAHIRO;ISHIDA MASAHIRO;YURI MASAAKI
分类号 C30B25/18;H01L21/205;H01L33/32 主分类号 C30B25/18
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