发明名称 POGO PIN BLOCK OF IC TESTER
摘要 PROBLEM TO BE SOLVED: To realize a pogo pin block of IC tester capable of shielding a coaxial contact probe without using a contact probe. SOLUTION: The improved pogo pin block of IC tester for electrically connecting a pin electronics board and a performance board has an insulating block, the coaxial contact probe provided to the insulating block to be electrically connected to the pin electronics board and the performance board to electrically connect both boards and a ground plate piercing through the hole of the coaxial contact probe to be electrically connected to the shield of the coaxial contact probe and electrically connected to the pin electronics board with a lead.
申请公布号 JP2002318246(A) 申请公布日期 2002.10.31
申请号 JP20010125428 申请日期 2001.04.24
申请人 YOKOGAWA ELECTRIC CORP 发明人 YOSHIKAWA YOSHIICHI
分类号 G01R31/26;G01R1/067;(IPC1-7):G01R1/067 主分类号 G01R31/26
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