发明名称 X-RAY MEASURING METHOD AND POLAR DIAGRAM MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To highly reliably perform measurement by resolving incorrectness in measurement based on fading phenomena which a stimulable fluorescent materials possess in the case of performing measurement through the use of the stimulable fluorescent material in a polar diagram measuring method and other X-ray measuring methods. SOLUTION: Different locations of the stimulable fluorescent material 2 is irradiated with X-rays R1 emergent from a sample S according to a predetermined timing pattern to accumulate data at each location. The data is corrected on the basis of the change characteristics with the passage of time of the energy holding characteristics of the stimulable fluorescent material 2, and the intensity distribution of X-rays is obtained on the basis of the data after the correction.
申请公布号 JP2002318210(A) 申请公布日期 2002.10.31
申请号 JP20010122073 申请日期 2001.04.20
申请人 RIGAKU CORP 发明人 DOSHIYOU AKIHIDE
分类号 G01N23/207;G01T1/00;G01T1/29;G03B42/02;(IPC1-7):G01N23/207 主分类号 G01N23/207
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