发明名称 |
A method of fault isolation of a digital electronic device |
摘要 |
<p>A method of fault isolation comprises the steps of attaching a probe to at least one pin of each sub-circuit (32-38) of the digital electronic device (10). A predefined stimulus (20) is sent to the digital electronic device and a transmission from 0 to 1 is counted for each of the probes to obtain a first sum. A transition from 1 to 0 is counted for each of the probes to obtain a second sum. The first and second sum are then compared to a predetermined criteria and a subset of the sub-circuits, which fail to meet the predetermined criteria, is determined. From the subset a sub-circuit is identified, which failed to meet the predetermined criteria and which is closest in signal progression to the predefined stimulus (20). <IMAGE></p> |
申请公布号 |
EP1253431(A2) |
申请公布日期 |
2002.10.30 |
申请号 |
EP20020076450 |
申请日期 |
2002.04.15 |
申请人 |
EASTMAN KODAK COMPANY |
发明人 |
PETRUCCELLI, GREGORY D.;HADGIS, GEORGE A.;LINK, BRUCE A. |
分类号 |
G01R31/317;G01R31/3181;H03K19/173;H03K19/21;(IPC1-7):G01R31/318 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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