发明名称 X-ray examination device and method for producing undistorted X-ray images
摘要 In an X-ray examination device and a method for generating distortion-free X-ray images the imaging properties are calculated and distortions are corrected by providing at least one calibration member (7, 8) for forming a reference pattern; a correction unit (13) corrects the distortions in X-ray images on the basis of the pattern of the calibration members (7, 8) actually formed in the patient X-ray image (FIG. 4) and the calculated reference pattern.
申请公布号 US6471399(B1) 申请公布日期 2002.10.29
申请号 US20000601894 申请日期 2000.08.08
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 ZYLKA WALDERMAR;SABCZYNSKI JORG;WEESE JUERGEN
分类号 G01B15/04;A61B6/00;G01T1/00;G01T7/00;G06T1/00;G06T3/00;(IPC1-7):G01D18/00 主分类号 G01B15/04
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