发明名称 |
X-ray examination device and method for producing undistorted X-ray images |
摘要 |
In an X-ray examination device and a method for generating distortion-free X-ray images the imaging properties are calculated and distortions are corrected by providing at least one calibration member (7, 8) for forming a reference pattern; a correction unit (13) corrects the distortions in X-ray images on the basis of the pattern of the calibration members (7, 8) actually formed in the patient X-ray image (FIG. 4) and the calculated reference pattern.
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申请公布号 |
US6471399(B1) |
申请公布日期 |
2002.10.29 |
申请号 |
US20000601894 |
申请日期 |
2000.08.08 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
ZYLKA WALDERMAR;SABCZYNSKI JORG;WEESE JUERGEN |
分类号 |
G01B15/04;A61B6/00;G01T1/00;G01T7/00;G06T1/00;G06T3/00;(IPC1-7):G01D18/00 |
主分类号 |
G01B15/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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